[PDF.29cg] Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
[PDF.ni34] Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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| #5012581 in Books | Springer | 2009-11-04 | Original language:English | PDF # 1 | 9.21 x.50 x6.14l,.97 | File type: PDF | 171 pages | ||From the Back Cover||Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies |by: |Alberto Bosio |Luigi Dilillo |Patrick Girard |Serge Pravossoudovitch |Arnaud Virazel | | | |Modern electronics depends on
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but t...
You can specify the type of files you want, for your device.Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Which are the reasons I like to read books. Great story by a great author.