[PDF.77ry] Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
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Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
From Singhee Amith Rutenbar Rob A
[PDF.tt95] Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
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| #4581140 in Books | Singhee Amith Rutenbar Rob A | 2010-09-17 | Original language:English | PDF # 1 | 9.21 x.63 x6.14l,1.19 | File type: PDF | 246 pages | Extreme Statistics in Nanoscale Memory Design||From the Back Cover|Extreme Statistics in Nanoscale Memory Design brings together some of the world’s leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in o
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditiona...
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