[PDF.62em] ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California
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ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California
ASM International
[PDF.sj49] ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis, November 11-15, Santa Clara, California
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| #9412114 in Books | 2001-11-01 | Original language:English | 10.50 x8.00 x1.00l, | File type: PDF | 550 pages|
Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused...
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