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| #9873091 in Books | Tehranipoor Mohammad Ahmed Nisar | 2011-12-14 | Original language:English | PDF # 1 | 9.25 x.68 x6.10l,.93 | File type: PDF | 281 pages | Nanometer Technology Designs High Quality Delay Tests||From the Back Cover||While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-rela
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transitio...
You easily download any file type for your gadget.Nanometer Technology Designs: High-Quality Delay Tests | Nisar Ahmed.Not only was the story interesting, engaging and relatable, it also teaches lessons.
