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Silver Metallization: Stability and Reliability (Engineering Materials and Processes)
Daniel Adams, Terry L. Alford, James W. Mayer
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Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer epub Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer pdf download Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer pdf file Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer audiobook Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer book review Silver Metallization: Stability and Daniel Adams, Terry L. Alford, James W. Mayer summary
| #6312712 in Books | Springer London | 2007-12-10 | Original language:English | PDF # 1 | 9.21 x.38 x6.14l,.70 | File type: PDF | 123 pages | ||||From the reviews:“This book is aimed at addressing and reviewing the engineering aspects of improving the thermal and electrical stability of silver with a view to use as an interconnect material in integrated circuits. … this book can provide a
Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the issues that have prevented silver from being used as ...
You can specify the type of files you want, for your device.Silver Metallization: Stability and Reliability (Engineering Materials and Processes) | Daniel Adams, Terry L. Alford, James W. Mayer. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.