[PDF.99yi] Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

[PDF.vp83] Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

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 | #7079071 in Books |  Springer |  1989-12-31 | Original language:English | PDF # 1 |  9.21 x.63 x6.14l,1.19 | File type: PDF | 232 pages

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In the last few years CMOS technology has become increas­ ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den­ sity and low power requirement. The ability to realize very com­ plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance­ ments in this area pose many new problems in the area of testing. Testi...

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